Scanning polarized RF reference sources for angular orientation measurement for munitions and the like

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United States of America Patent

PATENT NO 8446577
APP PUB NO 20120313812A1
SERIAL NO

12645436

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Abstract

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A method for determining an angular orientation of a sensor relative to a source. The method including: amplitude modulating at least two synchronized polarized Radio Frequency (RF) carrier signals with a predetermined relationship between their amplitude modulation of their electric field components and their polarization states to provide a scanning polarized RF reference source with a desired scanning range, pattern and frequency; detecting the scanning polarized RF reference source at the sensor; and using peak detection or pattern matching analysis on a signal detected at the sensor to determine the angular orientation of the sensor relative to scanning polarized RF reference source.

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Patent Owner(s)

Patent OwnerAddress
OMNITEK PARTNERS LLC85 AIR PARK DRIVE UNIT 3 RONKONKOMA NY 11779

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Rastegar, Jahangir S Stony Brook, US 404 2734

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