Mode synthesizing atomic force microscopy and mode-synthesizing sensing
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United States of America Patent
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May 21, 2013
Grant Date -
Sep 22, 2011
app pub date -
Mar 17, 2010
filing date -
Mar 17, 2010
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Abstract
A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.
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