Exposure apparatus, method for producing device, and method for controlling exposure apparatus

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United States of America Patent

PATENT NO 8451424
SERIAL NO

11338661

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Abstract

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An exposure apparatus (EX) exposes a substrate (P) by projecting an image of a pattern on the substrate (P) via a projection optical system (PL) and a liquid (1). The exposure device (EX) has a liquid supply mechanism (10) which supplies the liquid (1) between the projection optical system (PL) and the substrate (P). The liquid feeding mechanism (10) stops the supply of the liquid (1) when abnormality is detected. This suppresses influence to devices and members in the periphery of the substrate caused by leakage of the liquid forming a liquid immersion area, thereby realizing satisfactory exposure processing.

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Patent Owner(s)

Patent OwnerAddress
NIKON CORPORATION1-5-20 NISHIOI SHINAGAWA-KU TOKYO 1408601 ?1408601

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kadota, Hisatsune Hachioji, JP 3 17
Kobayashi, Naoyuki Fukaya, JP 78 1587
Magome, Nobutaka Kumagaya, JP 97 3606
Sakakibara, Yasuyuki Moriya, JP 68 1983
Takaiwa, Hiroaki Kumagaya, JP 47 872

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