Spacer elements for semiconductor device

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United States of America Patent

PATENT NO 8455952
APP PUB NO 20120126331A1
SERIAL NO

12951676

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Abstract

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The present disclosure describes a semiconductor device including a semiconductor substrate and a gate stack disposed on the semiconductor substrate. A first spacer element is disposed on the substrate abutting the first gate stack. In an embodiment, the first spacer element includes silicon nitride. A second spacer element is adjacent the first spacer element. In an embodiment, the second spacer element includes silicon oxide. A raised source and a first raised drain is provided laterally contacting sidewalls of the second spacer element. In an embodiment, a contact directly interfaces with the second spacer element.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD ("TSMC")NO 8 LI-HSIN RD 6 SCIENCE-BASED INDUSTRIAL PARK HSIN-CHU 300-77

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fan, Wei-Han Hsin-Chu, TW 33 241
Huang, Yimin Hsinchu, TW 114 1040
Lin, Yu-Hsien Hsinchu, TW 79 446
Lin, Yun Jing Hsinchu, TW 8 76

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