Semiconductor structure having an air-gap region and a method of manufacturing the same

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United States of America Patent

PATENT NO 8456009
SERIAL NO

12707969

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Abstract

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A semiconductor structure includes a first metal-containing layer, a dielectric capping layer, a second metal-containing layer, and a conductive pad. The first metal-containing layer includes a set of metal structures, a dielectric filler disposed to occupy a portion of the first metal-containing layer, and an air-gap region defined by at least the set of metal structures and the dielectric filler and abutting at least a portion of the set of metal structures. The second metal-containing layer includes at least a via plug electrically connected to a portion of the set of metal structures. The conductive pad and the via plug do not overlap the air-gap region.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTDHSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Dian-Hau Hsinchu, TW 189 1069
Huang, Cheng-Lin Hsinchu, TW 119 1373
Mii, Yuh-Jier Hsinchu, TW 29 661
Su, Shu-Hui Tucheng, TW 22 303
Wu, Ren-Guei Taoyuan, TW 3 241
Wu, Zhen-Cheng Hsinchu, TW 69 689
Yang, Jiing-Feng Zhubei, TW 19 702

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