Spacer shape engineering for void-free gap-filling process

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United States of America Patent

PATENT NO 8461654
APP PUB NO 20120025329A1
SERIAL NO

13270585

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Abstract

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A method of forming a semiconductor device includes providing a semiconductor substrate; forming a gate stack on the semiconductor substrate; forming a gate spacer adjacent to a sidewall of the gate stack; thinning the gate spacer; and forming a secondary gate spacer on a sidewall of the gate spacer after the step of thinning the gate spacer.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTDHSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chuang, Harry Singapore, SG 112 2756
Liang, Mong-Song Hsin-Chu, TW 207 4373
Mor, Yi-Shien Hsin-Chu, TW 41 1003
Peng, Chih-Tang Taipei, TW 74 691
Thei, Kong-Beng Hsin-Chu, TW 240 3239
Wu, Ming-Yuan Hsin-Chu, TW 69 851
Yeh, Chiung-Han Tainan, TW 43 4340

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