Logic built-in self-test system and method for applying a logic built-in self-test to a device under test
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United States of America Patent
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Jun 11, 2013
Grant Date -
Sep 15, 2011
app pub date -
Nov 24, 2008
filing date -
Nov 24, 2008
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Abstract
A logic built-in self test (LBIST) system comprises a device under test having a first plurality of first bistable multivibrator circuits an LBIST controller, and a second plurality of second bistable multivibrator circuits. Each second bistable multivibrator circuit is coupled to a corresponding first bistable multivibrator circuit to swap a second state value kept by the second bistable multivibrator circuit with a first state value kept by the corresponding first bistable multivibrator circuit depending on a first control signal from the LBIST controller and the second bistable multivibrator circuits are coupled to form one or more scan chains when receiving a second control signal from the LBIST controller.
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