Adjustable voltage comparing circuit and adjustable voltage examining device
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United States of America Patent
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Jun 25, 2013
Grant Date -
May 24, 2012
app pub date -
May 24, 2011
filing date -
May 24, 2010
priority date (Note) -
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Abstract
In an adjustable voltage examining module, while a logic tester issues an input signal to an audio module under test, upper/low-threshold reference signals are simultaneously issued to an adjustable voltage comparing circuit. While the adjustable voltage comparing circuit receives a signal under test returned by the to-be-examined audio module after a while, the adjustable voltage comparing circuit loads both an high-threshold reference voltage and a low-threshold reference voltage respectively indicated by the reference upper/low-threshold signal so as to compare both the upper and low-threshold reference voltages with the signal under test. Therefore, while the signal under test is examined to acquire a voltage level between voltage levels of the upper and low-threshold reference signals, precise operations of the audio module under test are assured, and time wasted by continuously-issued interrupt is saved.
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