Method and apparatus for controlling a microscope
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United States of America Patent
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Jun 25, 2013
Grant Date -
Jul 15, 2010
app pub date -
Jan 11, 2010
filing date -
Jan 9, 2009
priority date (Note) -
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Abstract
In accordance with the present invention there is provided a method for controlling a microscope to scan a microscope slide. By analyzing an overview image it is determined quantatively which swathe contains the most image detail and an optimum scanning order can subsequently be determined relative to the swathe determined as having the most detail. By scanning the swathe with the most detail first a good focus characteristic can be established for a dynamic focussing system and prediction errors in the dynamic focus system are likely to be low when scanning subsequent swathes.
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