Method for manufacturing contact and semiconductor device having said contact

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United States of America Patent

PATENT NO 8513742
APP PUB NO 20120223398A1
SERIAL NO

13144887

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Abstract

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The present invention relates to a method for manufacturing a contact and a semiconductor device having said contact. The present invention proposes to form first a trench contract of relatively large size, then to form one or more dielectric layer(s) within the trench contact, and then to remove the upper part of the dielectric layer(s) and to fill the same with a conductive material. The use of such a method makes it easy to form a trench contact of relatively large size which is easy for manufacturing; besides, since dielectric layer(s) is/are formed in the trench contact, thence capacitance between a source/drain trench contact and a gate electrode is reduced accordingly.

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Patent Owner(s)

  • INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Liang, Qingqing Beijing, CN 167 2535
Zhong, Huicai Beijing, CN 108 1677

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