User designated measurement display system and method for NDT/NDI with high rate input data
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United States of America Patent
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Aug 27, 2013
Grant Date -
Apr 22, 2010
app pub date -
Oct 20, 2008
filing date -
Oct 20, 2008
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Abstract
A user configured measurement display system and method for a non-destructive testing device and instrument (NDT/NDI) with high input data rate is disclosed. The system and the method provide the means for NDT/NDI instruments display measurement values that satisfies user designated measurement criterion occurring during any measurement time intervals (MTIs). The present disclosure overcomes the shortcomings of conventional ways of picking and displaying measurement values at fixed MTIs, by which the values truly satisfying the measurement criterion that occurs at random MTIs (other than scheduled MTIs) are often skipped.
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