Light emitting component measuring system and the method thereof
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United States of America Patent
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Sep 3, 2013
Grant Date -
Oct 4, 2012
app pub date -
Sep 26, 2011
filing date -
Apr 14, 2011
priority date (Note) -
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Abstract
The invention discloses a light emitting component measuring system and the method thereof which is capable of measuring the optical proprieties of a plurality of the devices under test (DUT). Each DUT is capable of receiving electricity so as to output an initial ray, wherein each initial ray has a first wavelength range. The light emitting component measuring system comprises a filtering device and a sensing device. The filtering device comprises a first filtering portion which can filter a corresponding third wavelength of the said initial rays and output a plurality of first filtered rays simultaneously. Each first filtered ray has a second wavelength range respectively. The said sensing device receives the ray outputted from the filtering device and generates an optical data accordingly.
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