Apparatus for absolute variable angle specular reflectance measurements
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United States of America Patent
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Sep 10, 2013
Grant Date -
Jan 26, 2012
app pub date -
Jun 21, 2011
filing date -
Jul 21, 2010
priority date (Note) -
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Abstract
An apparatus for measuring specular reflectance of a sample is provided including a light source for transmitting a beam of light at an angle of incidence onto a surface of a sample; a polarizing filter comprising a wire grid that avoids a need for collimation of the incident beam of light; a sample holder for mounting the sample; and a detector assembly for detecting a beam of light which is specularly reflected from a surface of the sample; wherein the sample holder and detector assembly are mounted for relative movement, such that the light source, the detector assembly and the sample holder are relatively positionable for a specularly reflected component of a transmitted light beam to be detected for different angles of incidence of the light beam.
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