Storage device testing system with a conductive heating assembly

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United States of America Patent

PATENT NO 8547123
APP PUB NO 20110012632A1
SERIAL NO

12836915

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Abstract

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A test slot assembly is provided for testing a storage device. The test slot assembly is configured to receive and support a storage device, or a storage device supported by a storage device transporter. The test slot assembly also includes a conductive heating assembly. The conductive heating assembly is arranged to heat a storage device by way of thermal conduction.

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Patent Owner(s)

  • TERADYNE, INC.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Akers, Larry W Westford, US 8 263
Merrow, Brian S Harvard, US 50 1843

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