High throughput birefringence measurement
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United States of America Patent
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Nov 12, 2013
Grant Date -
Jul 28, 2011
app pub date -
Jul 2, 2009
filing date -
Jul 8, 2008
priority date (Note) -
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Abstract
Improving the throughput of systems for measuring birefringence of optical samples includes techniques for directing multiple beams through the photoelastic modulator component of the system so that, along with expanded detection mechanisms to accommodate the multiple beams, the heretofore scanning (via a single beam) of a line across the sample is considerably enlarged so that several lines covering a “swath” of the sample area is scanned by the system of the present invention.
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