System and method for improved testing of electronic devices
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United States of America Patent
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Dec 3, 2013
Grant Date -
Nov 10, 2011
app pub date -
May 4, 2010
filing date -
May 4, 2010
priority date (Note) -
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Abstract
An improved method of testing and sorting electronic devices uses two or more test stations and two or more sorting stations applied to a single track to improve system throughput. Applying two or more test stations and two or more sorting stations to a single track accomplishes improved system throughput while increasing system cost less than would be expected if a duplicate track was installed for each test station.
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