System and process for high-density, low-energy plasma enhanced vapor phase epitaxy

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United States of America Patent

PATENT NO 8647434
APP PUB NO 20080152903A1
SERIAL NO

11817208

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Abstract

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An apparatus and process for fast epitaxial deposition of compound semiconductor layers includes a low-energy, high-density plasma generating apparatus for plasma enhanced vapor phase epitaxy. The process provides in one step, combining one or more metal vapors with gases of non-metallic elements in a deposition chamber. Then highly activating the gases in the presence of a dense, low-energy plasma. Concurrently reacting the metal vapor with the highly activated gases and depositing the reaction product on a heated substrate in communication with a support immersed in the plasma, to form a semiconductor layer on the substrate. The process is carbon-free and especially suited for epitaxial growth of nitride semiconductors at growth rates up to 10 nm/s and substrate temperatures below 1000° C. on large-area silicon substrates. The process requires neither carbon-containing gases nor gases releasing hydrogen, and in the absence of toxic carrier or reagent gases, is environment friendly.

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Patent Owner(s)

Patent OwnerAddress
SULZER METCO AG5610 WOHLEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Von, Kaenel Hans Zürich, CH 7 450

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