System and process for high-density, low-energy plasma enhanced vapor phase epitaxy
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United States of America Patent
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Feb 11, 2014
Grant Date -
Jun 26, 2008
app pub date -
Feb 28, 2006
filing date -
Feb 28, 2005
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Abstract
An apparatus and process for fast epitaxial deposition of compound semiconductor layers includes a low-energy, high-density plasma generating apparatus for plasma enhanced vapor phase epitaxy. The process provides in one step, combining one or more metal vapors with gases of non-metallic elements in a deposition chamber. Then highly activating the gases in the presence of a dense, low-energy plasma. Concurrently reacting the metal vapor with the highly activated gases and depositing the reaction product on a heated substrate in communication with a support immersed in the plasma, to form a semiconductor layer on the substrate. The process is carbon-free and especially suited for epitaxial growth of nitride semiconductors at growth rates up to 10 nm/s and substrate temperatures below 1000° C. on large-area silicon substrates. The process requires neither carbon-containing gases nor gases releasing hydrogen, and in the absence of toxic carrier or reagent gases, is environment friendly.

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- 15 United States
- 10 France
- 8 Japan
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- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
SULZER METCO AG | 5610 WOHLEN |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
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Von, Kaenel Hans | Zürich, CH | 7 | 450 |
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11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Aug 11, 2025 |
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Surcharge - 11.5 year - Late payment within 6 months | $160.00 | $80.00 | $40.00 |
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
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