Controller to detect malfunctioning address of memory device
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United States of America Patent
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Mar 11, 2014
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N/A
app pub date -
Apr 29, 2013
filing date -
Apr 9, 2008
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Abstract
A controller including a non-volatile memory to store a repair address, and a memory control unit operatively coupled with the non-volatile memory. The memory control unit comprising a memory test function configured to detect a malfunctioning address of primary data storage elements within a memory device. The memory device being another semiconductor device separate from the controller. The memory test function configured to store the repair address in the non-volatile memory, the repair address indicating the malfunctioning address of the primary data storage element.
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