Method of manufacturing semiconductor element

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United States of America Patent

PATENT NO 8679870
APP PUB NO 20130149802A1
SERIAL NO

13687239

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Abstract

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Provided is a method of manufacturing a semiconductor element having at a cut portion with excellent quality, which minimizes a region on a silicon substrate necessary for cutting, and which prevents cutting water used when cutting by dicing is carried out from entering the semiconductor element. The method of manufacturing a semiconductor element includes: arranging, on the silicon substrate, multiple semiconductor element portions so as to be adjacent to one another; bonding the silicon substrate and a glass substrate together using the resin; and cutting the silicon substrate and the glass substrate, respectively, in a region in which the resin is provided, the cutting the silicon substrate and the glass substrate including: half-cutting the silicon substrate by dicing; cutting the glass substrate by scribing; and dividing the silicon substrate, the glass substrate, and the resin.

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Patent Owner(s)

Patent OwnerAddress
CANON KABUSHIKI KAISHAOHTA-KU TOKYO 146-8501

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Igarashi, Kazuya Kawasaki, JP 15 42
Kataoka, Ichiro Mobara, JP 97 2664

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