Chemical mechanical planarization pad with void network

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 8684794
APP PUB NO 20090258588A1
SERIAL NO

12185737

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Abstract

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A polishing pad and a method of producing a polishing pad. The method includes providing a mold, having a first cavity and a second cavity, wherein the first cavity defines a recess, providing a polymer matrix material including void forming elements in the recess, forming a polishing pad and removing at least a portion of the elements from the polishing pad forming void spaces within the polishing pad by one of a chemical method or mechanical method, prior to use in chemical/mechanical planarization procedures.

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Patent Owner(s)

Patent OwnerAddress
FNS TECH CO LTD246 SINGAL-RI JIKSAN-EUP SEOBUK-GU CHEONAN-SI CHUNG-NAM

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hsu, Oscar K Chelmsford, US 17 139
Lefevre, Paul Topsfield, US 16 156
Mathew, Anoop Peabody, US 9 44
Qiao, Scott Xin Macungie, US 6 30
Wells, David Adam Hudson, US 14 110
Wu, Guangwei Sunnyvale, US 17 171

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