System and method for analyzing alternatives in test plans

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United States of America Patent

PATENT NO 8689188
SERIAL NO

12557886

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Abstract

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A method includes creating an initial test plan including initial estimates of effort and defect distributions, creating an alternative test plan including alternative estimates of effort and defect distributions, and displaying at least one metric of the initial test plan and the alternative test plan side by side for comparison by a user.

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Patent Owner(s)

  • INTERNATIONAL BUSINESS MACHINES CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bassin, Kathryn A Endicott, US 25 462
Hess, Howard M Chicago, US 24 336
Kagan, Steven Oakbrook Terrace, US 21 401
Li, Shao C Beijing, CN 24 397
Li, Zhong J Beijing, CN 18 384
Liu, He H Beijing, CN 17 377
Skrabanek, Susan E Atlanta, US 18 432
Tan, Hua F Beijing, CN 17 377
Zhu, Jun Shanghai, CN 653 4369

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