Probe card for testing high-frequency signals
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United States of America Patent
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Apr 8, 2014
Grant Date -
Nov 17, 2011
app pub date -
May 11, 2011
filing date -
May 17, 2010
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A probe card includes a circuit board, a flexible substrate, and a plurality of probes. The flexible substrate includes a plurality of arrayed conductive strips. The plurality of conductive strips is electrically connected to the printed circuit board. The plurality of probes is fixed to the printed circuit board, and the end of each probe is attached to one corresponding conductive strip.
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