System and method for identifying defects in a material
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United States of America Patent
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Jun 10, 2014
Grant Date -
Feb 21, 2013
app pub date -
Aug 19, 2011
filing date -
Aug 19, 2011
priority date (Note) -
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Abstract
Described are computer-based methods and apparatuses, including computer program products, for identifying defects in a material. A set of features is identified based on an image of a material, wherein each feature in the set of features is a candidate portion of a defect in the material. A set of chained features is selected based on the set of features, wherein each chained feature comprises one or more features that represent candidate portions of a same defect in the material. A defect in the material is identified based on the set of chained features and the image.
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