Methods of forming a reversed pattern in a substrate

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United States of America Patent

PATENT NO 8758987
APP PUB NO 20110052883A1
SERIAL NO

12552879

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of forming a reversed pattern in a substrate. A resist on a substrate is exposed and developed to form a pattern therein, the patterned resist having a first polarity. The polarity of the patterned resist is reversed to a second polarity, and a reversal film is formed over the patterned resist having the second polarity. The patterned resist having the second polarity is removed, forming a pattern in the reversal film. The pattern in the reversal film is then transferred to the substrate. Additional methods of forming a reversed pattern in a substrate are disclosed, as is a semiconductor structure formed during the methods.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
deVilliers, Anton J Boise, US 150 890
Jain, Kaveri Boise, US 32 174

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