Patterning of submicron pillars in a memory array

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United States of America Patent

PATENT NO 8759176
APP PUB NO 20090224244A1
SERIAL NO

12422072

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Abstract

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Methods in accordance with the invention involve patterning and etching very small dimension pillars, such as in formation of a memory array in accordance with the invention. When dimensions of pillars become very small, the photoresist pillars used to pattern them may not have sufficient mechanical strength to survive the photoresist exposure and development process. Using methods according to the present invention, these photoresist pillars are printed and developed larger than their intended final dimension, such that they have increased mechanical strength, then are shrunk to the desired dimension during a preliminary etch performed before the etch of underlying material begins.

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Patent Owner(s)

  • SANDISK TECHNOLOGIES LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Konevecki, Michael W San Jose, US 19 1100
Raghuram, Usha San Jose, US 38 1155

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