Method for processing samples held by a nanomanipulator

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United States of America Patent

PATENT NO 8759765
SERIAL NO

13567487

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Abstract

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A method for processing a sample in a charged-particle beam microscope. A sample is collected from a substrate and the sample is attached to the tip of a nanomanipulator. The sample is optionally oriented to optimize further processing. The nanomanipulator tip is brought into contact with a stabilizing support to minimize drift or vibration of the sample. The attached sample is then stabilized and available for preparation and analysis.

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Patent Owner(s)

Patent OwnerAddress
OXFORD INSTRUMENTS AMERICA INC300 BAKER AVE SUITE 150 CONCORD MA 01742

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hartfield, Cheryl D Dallas, US 2 8
Miller, Brian P Dallas, US 1 0
Moore, Thomas M Dallas, US 40 566

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