CT measurement with multiple X-ray sources

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United States of America Patent

PATENT NO 8768030
APP PUB NO 20110188724A1
SERIAL NO

13020256

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Abstract

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A method is disclosed for reconstructing image data of an examination object from measurement data of a computed tomography system, the examination object having been irradiated simultaneously by a number of X-ray sources while the measurement data was being acquired so that different projections of the examination object associated with the number of X-ray sources were acquired simultaneously for each detector element. In at least one embodiment, different iteration images of the examination object are determined one after the other from the measurement data by way of an iterative algorithm, a computation operation being employed with the iterative algorithm, which is applied to the iteration images and takes the presence of the number of X-ray sources into account.

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Patent Owner(s)

  • SIEMENS HEALTHCARE GMBH

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bruder, Herbert Höchstadt, DE 105 1155
Stierstorfer, Karl Erlangen, DE 97 881

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