Nonvolatile semiconductor memory device

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United States of America Patent

PATENT NO 8779498
APP PUB NO 20140061764A1
SERIAL NO

13750037

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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According to one embodiment, a nonvolatile semiconductor memory device includes a semiconductor substrate, a first gate insulating film, a charge storage layer, a second gate insulating film, and a control gate electrode. The first gate insulating film is arranged on the semiconductor substrate. The charge storage layer is arranged on the first gate insulating film, and includes aluminum and silicon. The second gate insulating film is arranged on the charge storage layer, and includes aluminum, silicon, and lanthanum. The control gate electrode is arranged on the second gate insulating film.

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Patent Owner(s)

  • TOSHIBA MEMORY CORPORATION

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Matsushita, Daisuke Fujisawa, JP 83 715
Takashima, Akira Fuchu, JP 130 2685

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