Techniques for explicit feedback delay measurement

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United States of America Patent

PATENT NO 8781017
APP PUB NO 20130230079A1
SERIAL NO

13410862

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Abstract

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Techniques for explicit feedback delay measurement are described. An apparatus may comprise a processor to generate a steering matrix for transmit spatial processing over a channel, determine a delay time associated with explicit feedback information for the channel, and determine whether to modify the steering matrix with the explicit feedback information based on the delay time. Other embodiments are described and claimed.

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Patent Owner(s)

  • INTEL CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Assaf, Kasher Haifa, IL 3 76
Gal, Basson Haifa, IL 3 76
Jorge, Myszne Zikhron Ya Akov, IL 3 76
Oren, Kaidar Binyamina, IL 3 76
Solomon, Trainin B Haifa, IL 3 76

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