Method and a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samples
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jul 22, 2014
Grant Date -
May 16, 2013
app pub date -
Jul 28, 2011
filing date -
Jul 30, 2010
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method is used in a time-of-flight mass spectrometer for analysis of a first pulsed ion beam, the ions of which are disposed along the pulse direction, separated with respect to their ion masses. The ions of at least one individual predetermined ion mass or of at least one predetermined range of ion masses can be decoupled from the first pulsed ion beam, as at least one decoupled ion beam, and the first ion beam and the at least one decoupled ion beam are analyzed.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully