Low-power dual-edge-triggered storage cell with scan test support and clock gating circuit therefor

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United States of America Patent

PATENT NO 8786344
APP PUB NO 20120001669A1
SERIAL NO

13203792

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Abstract

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A storage cell having a pulse generator and a storage element is proposed. The storage element input is connected to receive a data input signal. The storage element output is connected to provide a data output signal. The storage element is operable in one of a data retention state and a data transfer state in response to a storage control signal received from the pulse generator. The pulse generator is connected to receive a clock signal with rising and falling clock signal edges and is adapted to provide control pulses in the storage control signal. Each control pulse has a leading edge and a trailing edge. The control pulses have a polarity suited to invoke the data transfer state on their leading edges. The novel feature is that the pulse generator is adapted to initiate a rising-edge control pulse when receiving a rising clock signal edge and to initiate a falling-edge control pulse when receiving a falling clock signal edge. In this way, a dual-edge-triggered flip-flop may be made using only combinatorial logic circuitry and one level- or single-edge-triggered storage element. The storage cell has low power consumption, facilitates scan testing and can be used by existing design tools and test equipment.

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Patent Owner(s)

  • OTICON A/S

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Salling, Jakob Smørum, DK 2 12

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