Measuring method of critical current density of superconductor wires using measurement of magnetization loss
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United States of America Patent
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Jul 22, 2014
Grant Date -
Nov 3, 2011
app pub date -
Jul 28, 2010
filing date -
Nov 20, 2009
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Abstract
A method for measuring critical current density of superconductor wires according to the present invention is characterized in that it includes: (a) applying an external magnetic field to the superconductor wires, (b) measuring a magnetization loss of the superconductor wires according to the application of the external magnetic field, (c) normalizing the measured magnetization loss, and then calculating a fully-penetration magnetic field of the superconductor wires according to the normalized magnetization loss, (d) calculating a critical current density of the superconductor wires according to the calculated fully-penetration magnetic field. Therefore, the critical current density of parallel superconductor wires such as stacked superconductor wires may be measured without applying current to the superconductor wires directly.
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