Reliability, availability, and serviceability in a memory device
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United States of America Patent
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Aug 12, 2014
Grant Date -
Oct 14, 2010
app pub date -
Jun 28, 2010
filing date -
Jun 30, 2006
priority date (Note) -
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Abstract
Embodiments of the invention are generally directed to improving the reliability, availability, and serviceability of a memory device. In some embodiments, a memory device includes a memory core having a first portion to store data bits and a second portion to store error correction code (ECC) bits corresponding to the data bits. The memory device may also include error correction logic on the same die as the memory core. In some embodiments, the error correction logic enables the memory device to compute ECC bits and to compare the stored ECC bits with the computed ECC bits.
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