Manufacturing apparatus and method for semiconductor device and cleaning method of manufacturing apparatus for semiconductor

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United States of America Patent

PATENT NO 8815711
APP PUB NO 20110312187A1
SERIAL NO

13160209

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A manufacturing apparatus for a semiconductor device, including: a reaction chamber configured to perform film formation on a wafer; a process gas supplying mechanism provided in an upper part of the reaction chamber and configured to introduce process gas to an interior of the reaction chamber; a gas discharging mechanism provided in a lower part of the reaction chamber and configured to discharge gas from the reaction chamber; a supporting member configured to hold the wafer; a cleaning gas supplying mechanism provided in an outer periphery of the supporting member and configured to emit cleaning gas in an outer periphery direction below an upper end of the supporting member; a heater configured to heat the wafer; and a rotary driving mechanism configured to rotate the wafer.

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Patent Owner(s)

  • DENSO CORPORATION;TOYOTA JIDOSHA KABUSHIKI KAISHA

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ito, Hideki Numazu, JP 231 1754
Ito, Masahiko Kanagawa, JP 139 1876
Kamata, Isaho Kanagawa, JP 35 223
Suzuki, Kunihiko Shizuoka-ken, JP 262 4121
Tsuchida, Hidekazu Kanagawa, JP 55 362

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