Reactive material for integrated circuit tamper detection and response
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United States of America Patent
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Aug 26, 2014
Grant Date -
Apr 17, 2014
app pub date -
Oct 17, 2012
filing date -
Oct 17, 2012
priority date (Note) -
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Abstract
The present disclosure relates to integrated circuits having tamper detection and response devices and methods for manufacturing such integrated circuits. One integrated circuit having a tamper detection and response device includes at least one reactive material and at least one memory cell coupled to the at least one reactive material. An exothermic reaction in the at least one reactive material causes an alteration to a memory state of the at least one memory cell. Another integrated circuit having a tamper detection and response device includes a substrate, at least one gate on the substrate, and a reactive material between a first well and a second well of the at least one gate. A reaction in the reactive material causes a short in the gate.
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