Method and apparatus for interrogating electronic equipment components

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United States of America Patent

PATENT NO 8829934
SERIAL NO

12919823

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Abstract

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An apparatus for interrogating an electronic circuit supported by a substrate includes a tester external to the substrate and comprising an tester transceiver. A testing circuit is supported by the substrate and connected to the electronic circuit. The testing circuit includes a processor and a testing circuit transceiver in communication with the tester transceiver for transmitting instructions from the tester to the processor and for transmitting results of an interrogation from the processor to the tester. The processor being programmed to process instructions from the tester to interrogate the electronic circuit with an interrogation corresponding to the instructions.

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Patent Owner(s)

  • SCANIMETRICS INC.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Moore, Brian Edmonton, CA 78 1844
Sellathamby, Christopher V Edmonton, CA 8 451
Slupsky, Steven Edmonton, CA 13 742

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