Pseudo dual-energy material identification system and method with undersampling
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United States of America Patent
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Sep 9, 2014
Grant Date -
May 31, 2012
app pub date -
Dec 30, 2009
filing date -
May 27, 2009
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Abstract
Pseudo dual-energy material identification systems and methods with under-sampling are disclosed. The system comprises a ray generating device, a mechanic rotation control section, a data collecting subsystem comprising a first tier of detectors and a second tier of detectors, and a master control and data processing computer. The system utilizes a CT-imaging-based material identification method with under-sampled dual-energy projection data, in which only a few detectors at the second tier are used to perform dual-energy projection data sampling, and optimization is made on the procedure of solving an equation system.
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