Method of avoiding space charge saturation effects in an ion trap

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United States of America Patent

PATENT NO 8835836
APP PUB NO 20130112865A1
SERIAL NO

13722301

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Abstract

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A mass spectrometer includes a first ion trap arranged upstream of an analytical second ion trap. The charge capacity of the first ion trap is set at a value such that if all the ions stored within the first ion trap up to the charge capacity limit of the first ion trap are then transferred to the second ion trap, then the analytical performance of the second ion trap is not substantially degraded due to space charge effects.

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Patent Owner(s)

  • MICROMASS UK LIMITED

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Green, Martin Raymond Cheshire, GB 160 808
Wildgoose, Jason Lee Stockpot, GB 221 2087

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