Systems and methods for investigating a characteristic of a material using electron microscopy

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United States of America Patent

PATENT NO 8835842
SERIAL NO

13746382

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Abstract

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Various embodiments of the present invention provide systems and methods for determining an characteristic of a material. The characteristics may include, but are not limited to, crystallographic and chemical composition characteristics of a material.

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  • EDAX

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chan, Lisa H Nyack, US 1 0
de, Kloe Peter A Dongen, NL 2 0
Nowell, Matthew M Riverton, US 2 0
Nylese, Tera Lyn Pearl River, US 1 0
Wright, Stuart I Orem, US 2 0

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