Semiconductor memory device detecting error
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United States of America Patent
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Oct 7, 2014
Grant Date -
Feb 2, 2012
app pub date -
Jul 29, 2011
filing date -
Jul 29, 2010
priority date (Note) -
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Abstract
According to one embodiment, a semiconductor memory device includes first to fifth units. The first unit compares first data being write target data before write in a memory, with second data written in the memory and then read out. The second unit stores the first data if a data comparison result indicates mismatch. The third unit stores a write address corresponding to the write target data if the data comparison result indicates mismatch. The fourth unit compares a read address corresponding to read target data with an address stored in the third unit. The fifth unit selects data read out from the memory in accordance with the read address as the read target data if a address comparison result indicates mismatch, and selects data read out from the second unit as the read target data if the address comparison result indicates match.
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