Multi-level charge storage transistors and associated methods

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United States of America Patent

PATENT NO 8859349
APP PUB NO 20130130452A1
SERIAL NO

13745452

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Abstract

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Methods of fabricating charge storage transistors are described, along with apparatus and systems that include them. In one such method, a pillar of epitaxial silicon is formed. At least first and second charge storage nodes (e.g., floating gates) are formed around the pillar of epitaxial silicon at different levels. A control gate is formed around each of the charge storage nodes. Additional embodiments are also described.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ramaswamy, Durai Vishak Nirmal Boise, US 233 1246
Sandhu, Gurtej S Boise, US 1215 32269

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