Method and apparatus for testing devices using serially controlled intelligent switches
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United States of America Patent
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Oct 28, 2014
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app pub date -
Jul 8, 2011
filing date -
Sep 27, 2007
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Abstract
Methods and apparatus for testing devices using serially controlled intelligent switches have been described. In some embodiments, a probe card assembly can be provided that includes a plurality of integrated circuits (ICs) serially coupled to form a chain, the chain coupled to at least one serial control line, the plurality of ICs including switches coupled to test probes, each of the switches being programmable responsive to a control signal on the at least one serial control line.
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