Group III nitride semiconductor growth substrate, group III nitride semiconductor epitaxial substrate, group III nitride semiconductor element and group III nitride semiconductor free-standing substrate, and method of producing the same

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United States of America Patent

PATENT NO 8878189
SERIAL NO

13259788

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Abstract

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An object of the present invention is to provide a Group III nitride semiconductor epitaxial substrate, a Group III nitride semiconductor element, and a Group III nitride semiconductor free-standing substrate, which have good crystallinity, with not only AlGaN, GaN, and GaInN the growth temperature of which is 1050° C. or less, but also with AlxGa1-xN having a high Al composition, the growth temperature of which is high; a Group III nitride semiconductor growth substrate used for producing these, and a method for efficiently producing those. The present invention provides a Group III nitride semiconductor growth substrate comprising a crystal growth substrate including a surface portion composed of a Group III nitride semiconductor which contains at least Al, and a scandium nitride film formed on the surface portion are provided.

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DOWA ELECTRONICS MATERIALS CO LTDJAPAN
DOWA HOLDINGS CO LTD4-14-1 SOTOKANDA CHIYODA-KU TOKYO 101-0021

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kadowaki, Yoshitaka Chiyoda-ku, JP 27 69
Miyashita, Masahito Chiyoda-ku, JP 10 73
Toba, Ryuichi Chiyoda-ku, JP 28 105
Toyota, Tatsunori Chiyoda-ku, JP 14 41

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