Method and apparatus for detection of short stress waves

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United States of America Patent

PATENT NO 8880364
APP PUB NO 20120245867A1
SERIAL NO

13421632

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Abstract

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Systems, apparatuses, and methods for measuring microscopic vibration of machines, which include the use of a selectable high pass or band pass filter and an average power processor unit, among other things.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Czyzewski, Zbigniew Henderson, US 41 2399

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