Nonvolatile semiconductor memory device and method for manufacturing same

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United States of America Patent

PATENT NO 8884355
SERIAL NO

12727712

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Abstract

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A nonvolatile semiconductor memory device includes: a stacked structural unit including a plurality of electrode films and a plurality of inter-electrode insulating films alternately stacked in a first direction; a first selection gate electrode stacked on the stacked structural unit in the first direction; a first semiconductor pillar piercing the stacked structural unit and the first selection gate electrode in the first direction; a first memory unit provided at an intersection of each of the electrode films and the first semiconductor pillar; and a first selection gate insulating film provided between the first semiconductor pillar and the first selection gate electrode, the first selection gate electrode including a first silicide layer provided on a face of the first selection gate electrode perpendicular to the first direction.

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Patent Owner(s)

  • KABUSHIKI KAISHA TOSHIBA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aochi, Hideaki Kanagawa-ken, JP 245 11488
Fujiwara, Tomoko Kanagawa-ken, JP 55 1691
Fukuzumi, Yoshiaki Kanagawa-ken, JP 334 10815
Ishiduki, Megumi Mie-ken, JP 106 4997
Katsumata, Ryota Mie-ken, JP 205 10803
Kidoh, Masaru Tokyo, JP 143 9621
Kirisawa, Ryouhei Kanagawa-ken, JP 74 3500
Kito, Masaru Kanagawa-ken, JP 233 11022
Komori, Yosuke Mie-ken, JP 89 5081
Mikajiri, Yoshimasa Kanagawa-ken, JP 40 1440
Oota, Shigeto Kanagawa-ken, JP 38 1424
Tanaka, Hiroyasu Mie-ken, JP 249 10224

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