Probe pin and method of manufacturing the same
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United States of America Patent
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Nov 18, 2014
Issued Date -
N/A
app pub date -
Sep 14, 2012
filing date -
Feb 6, 2008
priority date (Note) -
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status (Latency Note)
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Abstract
A probe pin having a bent portion at its tip end portion is used for a probe card, the probe pin is configured such that an angle constituted by a direction of work groove generated at a time of machine-working of a tip end portion of the probe pin and a longitudinal direction of a metal wire is set to 45 degree or less, or both directions are set to be almost parallel to each other. Due to above configuration, even if the tip end portion of the probe pin is subjected to a bending work and a worked surface is formed with recessed portion, a breakage of the probe pin caused by the recessed portion existing on the worked surface and functioning as a starting point of the breakage can be effectively prevented whereby a lowering of a production yield of the probe pin can be greatly suppressed.
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