High speed testing of integrated circuits including resistive elements

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United States of America Patent

PATENT NO 8890567
SERIAL NO

12894636

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Abstract

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In one aspect, a method of testing an IC is provided. In one embodiment, the method includes: programming a resistive element in the IC at an intermediate ON state, where in addition to the intermediate ON state, the resistive element has another ON state, further where at the intermediate ON state, the resistive element has a resistance that is at least 10 times greater than a resistance of the resistive element at the another ON state; and applying test data to the resistive element.

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Patent Owner(s)

  • ALTERA CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lewis, David Toronto, CA 334 3613

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