Electrical characterization for a semiconductor device pin
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United States of America Patent
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Dec 9, 2014
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app pub date -
Aug 31, 2011
filing date -
Aug 31, 2011
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Abstract
Embodiments related to electrically characterizing a semiconductor device are provided. In one example, a method for characterizing a pin of a semiconductor device is provided, the method comprising providing a test pattern to the semiconductor device. Further, the method includes adjusting a selected electrical state of a pin of the semiconductor device and measuring a value for a dependent electrical state of the pin responsive to the selected electrical state. The example method also includes generating an electrical characterization for the pin by correlating the dependent electrical state with the selected electrical state and outputting the electrical characterization for display.
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