Image recording apparatus and recording defect inspection method for same
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United States of America Patent
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Jan 20, 2015
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app pub date -
Feb 8, 2013
filing date -
Feb 10, 2012
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Abstract
An aspect of a recording defect inspection method for an image recording apparatus includes: a recording step of sequentially recording test patterns of respective recording heads onto a recording medium, an image capturing step of capturing an image of a test pattern recorded on the recording medium by means of a scanner, an analysis step of analyzing the captured test pattern and detecting a recording defect of the recording head which has recorded the test pattern, an evaluation frequency setting step of setting an evaluation frequency for each of the recording heads on the basis of a recording defect occurrence frequency for each recording head, and a control step of setting a frequency of each of the recording heads in the test patterns to the set evaluation frequency.
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