Trend analysis and statistical process control using multitargeted screening assays
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United States of America Patent
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Feb 17, 2015
Grant Date -
Jun 1, 2006
app pub date -
Apr 15, 2005
filing date -
Apr 15, 2004
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Abstract
Aspects of the present invention provide novel multi-targeted microbiological screening and monitoring methods having substantial utility for monitoring and control of microbial growth and contaminants, microbiological processes, predictive microbiology, and for exposure and risk assessment. Microbial markers shared by both target and index microbes are used in novel methods for microbial monitoring, monitoring of microbial performance potential, trend analysis, and statistical process control (SPC) in processes or systems that are receptive to a plurality of genetically distinct microbes.
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